Resistance & Resistivity Measurement System
RMS-1000C High-Temp Conductive Material Resistivity System
RMS-1000C is designed for conductive materials resistivity measurement using 4-wire method, featuring nΩ-level precision, RT-1000°C temperature range, and vacuum/atmosphere environments for carbon, metal, and oxide materials.
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RTS-1000I High-Temp Insulation Material Resistivity System
RMS-1000I specializes in high-resistance insulation measurement using triple-ring electrode method, achieving 100Ω~10PΩ range with patented fixture design for aerospace and electronic applications.
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RTS-1000P High-Temp Four-Point Probe Resistivity System
RMS-1000P uses four-point probe method for thin film and wafer resistivity measurement, featuring dual-electrostatic measurement, 0.1mΩ~100MΩ range, and specialized fixture for semiconductor materials.
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RTS-1000S High-Temp Semiconductor Resistivity System
RMS-1000S is optimized for semiconductor bulk materials with two-wire method, offering 0.1mΩ~100MΩ measurement range, spring-loaded platinum electrodes, and multiple atmosphere environments for complex resistivity characterization.
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