Electronic thin films

Focus on solutions forcharacterizing and measuring

Suitable for characterizing and measuring the electrical properties of various materials.

Characterizing and measuring electronic thin films
A*STAR
NTU
Huawei
State Grid
Johnson Electric
Tsinghua University
CAS
CAEP
A*STAR
NTU
Huawei
State Grid
Johnson Electric
Tsinghua University
CAS
CAEP

We deliver full-lifecycle solutions for functional materials to empower every step of your innovation.

Whether you focus on R&D and preparation of advanced materials, high-precision analysis of complex dielectric and piezoelectric parameters, or enterprise-grade standardized quality control, our integrated platform meets your demanding requirements.

The backbone of advanced materials research

  • 12+ years

    Electrical characterization and precision instrumentation R&D

  • 8 categories

    Prep through testing—a complete workflow matrix, not single devices

  • 30+ patents

    Patent portfolio and proprietary Virtual Ground measurement

  • Fortune 500

    Trusted by global enterprises, universities, and research institutes