Overview
MatMeas CPS7000 Cryogenic Vacuum Probe Station – a compact benchtop system designed for precise electrical measurements of bulk, thin film, and multilayer materials. The instrument supports a wide temperature range from -160℃ to 450℃ using liquid nitrogen cooling, with excellent temperature stability (±0.5℃) and programmable ramp rates. Equipped with four micro-manipulated probe arms, it enables accurate contacting for diverse tests including dielectric, ferroelectric, piezoelectric, pyroelectric, and TSDC measurements. The CPS7000 is an essential tool for universities, research institutes, aerospace, and defense labs requiring reliable vacuum and variable-temperature probing.
Specifications
| Parameter | Value |
| Sample Size: | φ < 40 mm, thickness < 5 mm |
| Power Supply: | 220V ±10%, 50Hz |
| Measurement Temperature | ：-160℃ ~ 450℃ |
| Operating Environment | : -10℃ ~ 50℃ |
| Number of Probe Arms: | 4 |
| Cooling Method: | Liquid Nitrogen |
| Temperature Control Accuracy | ±5°C |
| Heating Rate Slopes | 0 ~ 10℃/min (typical 3℃/min) |
| Cooling Rate: | 1 ~ 10℃/min (programmable) |
| Optical Viewport: | φ55 mm quartz glass |
| Temperature Control Modes: | Heating,constant temperature, Heating/Cooling Cycling |
| Measurement Modules: | Dielectric, Resistance, Pyroelectric, TSDC |
| Operation Mode: | Semi-automatic |
| Equipment size | 435 × 435 × 205 mm (L × W × H) |
| Weight | 32kg |
| Warranty | 1 Year |
Applications
- Ferroelectric & Piezoelectric Materials
- Dielectric Thin Films
- Pyroelectric & TSDC Studies
- Optoelectronic Materials
- Semiconductor Devices
- Multiferroic & Memristor Research
FAQ
Why Choose the MatMeas CPS7000?
Benchmark Performance: Comparable to leading brands (Lake Shore, Janis) at a fraction of the cost.
No Temperature Jumps: Specially designed thermal stage ensures smooth temperature transitions without contact loss.
Modular Expandability: Compatible with external LCR meters, electrometers, and ferroelectric testers.
User-Friendly Software: Intuitive interface for temperature profiling and data acquisition.